List of changes in version 3.0:
- Added "RT Sigma" analyzer type.
- Added "Spectrum Offset" display modes.
- Made bottom group selector switchable.
- Fixed "zoom in" function's issue.
SPAN provides you with a very flexible “mode” system which you can use to setup your spectrum analyzer preferences. You may specify Fourier block size in samples, FFT window overlap percentage, spectrum's visual slope. Beside that you can choose to display secondary spectrum of a desired type (e.g. real-time maximum, all-time maximum). Spectrum can be smoothed out visually for an easier examination.
SPAN also features output level metering with adjustable ballistics and integration time, K-system metering (including calibration K-system metering). SPAN displays level metering statistics, headroom estimation and clipping detection. Correlation metering is available as well.
SPAN features:
- Output signal power statistics
- Spectrum smoothing
- User interface window resizing
- Clipping statistics
- Correlation meter
- K-metering
- Stereo and multi-channel analysis
- Mid/side analysis
- Internal channel routing
- Channel grouping
- Preset manager
- Undo/redo history
- A/B comparisons
- Contextual hint messages
- All sample rates support